Invention Grant
- Patent Title: Test pin array with electrostatic discharge protection
- Patent Title (中): 带静电放电保护的测试针阵列
-
Application No.: US14238847Application Date: 2011-08-16
-
Publication No.: US09408284B2Publication Date: 2016-08-02
- Inventor: Kek Hing Kow
- Applicant: Kek Hing Kow
- Applicant Address: CN Shenzhen
- Assignee: ESD TECHNOLOGY CONSULTING & LICENSING CO., LTD
- Current Assignee: ESD TECHNOLOGY CONSULTING & LICENSING CO., LTD
- Current Assignee Address: CN Shenzhen
- International Application: PCT/CN2011/078479 WO 20110816
- International Announcement: WO2013/023360 WO 20130221
- Main IPC: H01H47/00
- IPC: H01H47/00 ; H05F3/00 ; H01L23/60 ; G01R1/36 ; G01R1/067 ; G01R1/04 ; G01R1/18
Abstract:
A test pin array (21) array with electrostatic discharge protection comprises at least one modified test pin (22) with a static dissipative element (24) incorporated at its plunger tip (23). The use of the modified test among the test pin array provides an extremely low-cost alternative solution to the large scale testing of microchips without the use of any air ionizer.
Public/Granted literature
- US20140204500A1 TEST PIN ARRAY WITH ELECTROSTATIC DISCHARGE PROTECTION Public/Granted day:2014-07-24
Information query
