Invention Grant
- Patent Title: Appearance inspection device, appearance inspection method, and program
- Patent Title (中): 外观检查装置,外观检查方法和程序
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Application No.: US13971867Application Date: 2013-08-21
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Publication No.: US09410898B2Publication Date: 2016-08-09
- Inventor: Yasuhisa Ikushima
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2012-202271 20120914
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G06K9/03 ; G06T7/00

Abstract:
A burden on a user is reduced by referring to a measurement region set for a certain measurement tool among a plurality of measurement tools to be used by an appearance inspection device as a measurement region of another measurement tool. A reference point or a search region serving as a reference of measurement for a first measurement tool such as a connector dimension inspection tool is set for a basic image acquired by imaging a non-defective product. Next, a second measurement tool such as an area measurement tool that performs measurement separate from the first measurement tool is selected by the user. For coordinate data of a measurement region, which is a region to be measured by the second measurement tool, coordinate data of the reference point or the search region set for the first measurement tool is adjusted if necessary and referred to.
Public/Granted literature
- US20140078498A1 Appearance Inspection Device, Appearance Inspection Method, And Program Public/Granted day:2014-03-20
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