Invention Grant
- Patent Title: Handler and part inspection apparatus
- Patent Title (中): 处理器和零件检查装置
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Application No.: US13603996Application Date: 2012-09-05
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Publication No.: US09411012B2Publication Date: 2016-08-09
- Inventor: Nobuo Hasegawa , Hiroaki Fujimori , Toshioki Shimojima
- Applicant: Nobuo Hasegawa , Hiroaki Fujimori , Toshioki Shimojima
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2011-193666 20110906
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H01L23/00

Abstract:
A handler includes a base having an opening portion, a first hand which transports a transport target, a first transport section which transports the first hand to above the opening portion and moves the first hand down, a second hand which transports the transport target, a second transport section which transports the second hand to above the opening portion and moves the second hand down, and a control section which controls an operation of the first transport section and an operation of the second transport section. The handler has a state where the first hand and the second hand are disposed in parallel to the opening portion while being close to each other toward above the opening portion.
Public/Granted literature
- US20130057310A1 HANDLER AND PART INSPECTION APPARATUS Public/Granted day:2013-03-07
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