Invention Grant
US09411225B2 Photo acid generator, chemically amplified resist composition, and patterning process
有权
照相酸发生器,化学放大抗蚀剂组合物和图案化工艺
- Patent Title: Photo acid generator, chemically amplified resist composition, and patterning process
- Patent Title (中): 照相酸发生器,化学放大抗蚀剂组合物和图案化工艺
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Application No.: US14728620Application Date: 2015-06-02
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Publication No.: US09411225B2Publication Date: 2016-08-09
- Inventor: Masaki Ohashi , Masahiro Fukushima , Kenichi Oikawa , Koji Hasegawa
- Applicant: SHIN-ETSU CHEMICAL CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2014-139019 20140704
- Main IPC: G03F7/004
- IPC: G03F7/004 ; G03F7/039 ; G03F7/20 ; G03F7/30 ; G03F7/38 ; G03F7/09 ; G03F7/11 ; G03F1/20

Abstract:
A photo acid generator represented (1a), wherein R01 and R02 each independently represent a linear monovalent hydrocarbon group having 1 to 20 carbon atoms or a branched or cyclic monovalent hydrocarbon group having 3 to 20 carbon atoms which may be substituted with or interposed by a heteroatom; R03 represents a linear divalent hydrocarbon group having 1 to 30 carbon atoms or a branched or cyclic divalent hydrocarbon group having 3 to 30 carbon atoms which may be substituted with a heteroatom, or interposed by a heteroatom; and R01 and R02 may be mutually bonded to form a ring together with the sulfur atom in the formula. A photo acid generator can give a pattern excellent in resolution and LER and having a rectangular profile in the photolithography using a high energy beam like ArF excimer laser light, EUV, and electron beam as a light source.
Public/Granted literature
- US20160004155A1 PHOTO ACID GENERATOR, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS Public/Granted day:2016-01-07
Information query
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