Invention Grant
- Patent Title: System and method for determining input object information from proximity and force measurements
- Patent Title (中): 用于从邻近和力测量确定输入对象信息的系统和方法
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Application No.: US14320005Application Date: 2014-06-30
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Publication No.: US09411458B2Publication Date: 2016-08-09
- Inventor: Patrick Worfolk , Vijay Venkatesh Mahalingam
- Applicant: SYNAPTICS INCORPORATED
- Applicant Address: US CA San Jose
- Assignee: Synaptics Incorporated
- Current Assignee: Synaptics Incorporated
- Current Assignee Address: US CA San Jose
- Agency: Osha Liang LLP
- Main IPC: G06F3/045
- IPC: G06F3/045 ; G06F3/041 ; G06F3/044 ; G06F3/0354

Abstract:
A processing system for an input device having a sensing region overlapping an input surface and an array of sensor electrodes configured to form a plurality of proximity pixels and a plurality of force pixels. The processing system is configured to: determine a proximity image indicative of positional information for input objects; determine a force image indicative of local deflection of the input surface in response to force applied by the input objects; determine a respective group of proximity pixels from the proximity image corresponding to each input object; determine a respective group of force pixels from the force image corresponding to each determined group of proximity pixels; determine the position of each input object based on the determined groups of proximity pixels; and determine the force associated with each input object based on the determined groups of force pixels.
Public/Granted literature
- US20150378491A1 SYSTEM AND METHOD FOR DETERMINING INPUT OBJECT INFORMATION FROM PROXIMITY AND FORCE MEASUREMENTS Public/Granted day:2015-12-31
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