Invention Grant
- Patent Title: Low density parity check circuit
- Patent Title (中): 低密度奇偶校验电路
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Application No.: US14218315Application Date: 2014-03-18
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Publication No.: US09411684B2Publication Date: 2016-08-09
- Inventor: Joe F. Holt , Suresh Rajgopal , Jacob B. Derouen , Benjamin G. Hess
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; H03M13/11 ; H03M13/00

Abstract:
Generally discussed herein are Low Density Parity Check (LDPC) circuit layouts. An example LDPC circuit can include combinational logic and a plurality of memory units. Each of the plurality of memory units can be electrically coupled to each other and the combinational logic, and the plurality of memory units can be situated in a ring-like configuration.
Public/Granted literature
- US20150270851A1 LOW DENSITY PARITY CHECK CIRCUIT Public/Granted day:2015-09-24
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