Invention Grant
- Patent Title: Generating test data
- Patent Title (中): 生成测试数据
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Application No.: US12797509Application Date: 2010-06-09
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Publication No.: US09411712B2Publication Date: 2016-08-09
- Inventor: Carl Richard Feynman
- Applicant: Carl Richard Feynman
- Applicant Address: US MA Lexington
- Assignee: Ab Initio Technology LLC
- Current Assignee: Ab Initio Technology LLC
- Current Assignee Address: US MA Lexington
- Agency: Fish & Richardson P.C.
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G06F15/18 ; G06F11/36

Abstract:
Generating test data includes: reading values occurring in at least one field of multiple records from a data source; storing profile information including statistics characterizing the values; generating a model of a probability distribution for the field based on the statistics; generating multiple test data values using the generated model such that a frequency at which a given value occurs in the test data values corresponds to a probability assigned to that given value by the model; and storing a collection of test data including the test data values in a data storage system.
Public/Granted literature
- US20100318481A1 Generating Test Data Public/Granted day:2010-12-16
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