Invention Grant
US09412467B2 Semiconductor device having a test controller and method of operation
有权
具有测试控制器和操作方法的半导体器件
- Patent Title: Semiconductor device having a test controller and method of operation
- Patent Title (中): 具有测试控制器和操作方法的半导体器件
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Application No.: US14264473Application Date: 2014-04-29
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Publication No.: US09412467B2Publication Date: 2016-08-09
- Inventor: Chris P. Nappi , Stephen F. McGinty
- Applicant: Chris P. Nappi , Stephen F. McGinty
- Applicant Address: US TX Austin
- Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee Address: US TX Austin
- Main IPC: G11C29/38
- IPC: G11C29/38 ; G11C29/02 ; G11C29/16
Abstract:
A semiconductor device includes a test port configured to communicate with a test system, a test command controller coupled to communicate with the test port, a peripheral module configured to communicate with the test command controller, a processor, and a test memory configured to communicate with the test command controller and the processor. The test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module.
Public/Granted literature
- US20150310932A1 SEMICONDUCTOR DEVICE HAVING A TEST CONTROLLER AND METHOD OF OPERATION Public/Granted day:2015-10-29
Information query
