Invention Grant
- Patent Title: Capacitive coupling plasma processing apparatus
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Application No.: US14688205Application Date: 2015-04-16
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Publication No.: US09412562B2Publication Date: 2016-08-09
- Inventor: Shinji Himori , Tatsuo Matsudo
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-102954 20050331
- Main IPC: H01L21/00
- IPC: H01L21/00 ; C23C16/00 ; H01J37/32

Abstract:
A capacitive coupling plasma processing apparatus includes a process chamber configured to have a vacuum atmosphere, and a process gas supply section configured to supply a process gas into the chamber. In the chamber, a first electrode and a second electrode are disposed opposite each other. The second electrode includes a plurality of conductive segments separated from each other and facing the first electrode. An RF power supply is configured to apply an RF power to the first electrode to form an RF electric field within a plasma generation region between the first and second electrodes, so as to turn the process gas into plasma by the RF electric field. A DC power supply is configured to apply a DC voltage to at least one of the segments of the second electrode.
Public/Granted literature
- US20150221478A1 CAPACITIVE COUPLING PLASMA PROCESSING APPARATUS Public/Granted day:2015-08-06
Information query
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