Invention Grant
US09412595B2 Systems and methods for intelligent dispatching for wafer processing 有权
用于晶圆处理的智能调度系统和方法

Systems and methods for intelligent dispatching for wafer processing
Abstract:
Systems and methods are provided for ion implantation. For example, ion implantation is performed using a first ion implant tool. At least one condition parameter associated with the first ion implant tool is dynamically obtained. Whether the first ion implant tool is in a first condition is determined based on the at least one condition parameter. Ion implantation is performed using a second ion implant tool based on the determination.
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