Invention Grant
US09412691B2 Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrier 有权
具有双面芯片接入的芯片载体和使用芯片载体测试芯片的方法

Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrier
Abstract:
Disclosed are chip carriers and methods of using them. The chip carriers each comprise a base with a first surface, a second surface opposite the first surface, and wire bond pads on the first and second surfaces. The first surface also has a chip attach area with opening(s) that extends from the first surface to the second surface. A chip can be attached to the chip attach area and, because of the opening(s), wire bond pads on opposite sides (e.g., on the top and bottom) of the chip are accessible for testing. That is, wire bond pads on the first surface can be electrically connected to one side of the chip (e.g., to the top of the chip) and/or wire bond pads on the second surface can be electrically connected through the opening(s) to the opposite side of the chip (e.g., to the bottom of the chip).
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