Invention Grant
US09412691B2 Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrier
有权
具有双面芯片接入的芯片载体和使用芯片载体测试芯片的方法
- Patent Title: Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrier
- Patent Title (中): 具有双面芯片接入的芯片载体和使用芯片载体测试芯片的方法
-
Application No.: US14558782Application Date: 2014-12-03
-
Publication No.: US09412691B2Publication Date: 2016-08-09
- Inventor: Heather M. Truax , Jared P. Yanofsky
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Gibb & Riley, LLC
- Agent Michael J. LeStrange, Esq.
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H01L23/498 ; H01L23/00 ; H01L23/48 ; G01R31/28

Abstract:
Disclosed are chip carriers and methods of using them. The chip carriers each comprise a base with a first surface, a second surface opposite the first surface, and wire bond pads on the first and second surfaces. The first surface also has a chip attach area with opening(s) that extends from the first surface to the second surface. A chip can be attached to the chip attach area and, because of the opening(s), wire bond pads on opposite sides (e.g., on the top and bottom) of the chip are accessible for testing. That is, wire bond pads on the first surface can be electrically connected to one side of the chip (e.g., to the top of the chip) and/or wire bond pads on the second surface can be electrically connected through the opening(s) to the opposite side of the chip (e.g., to the bottom of the chip).
Public/Granted literature
- US20160163631A1 CHIP CARRIER WITH DUAL-SIDED CHIP ACCESS AND A METHOD FOR TESTING A CHIP USING THE CHIP CARRIER Public/Granted day:2016-06-09
Information query