Invention Grant
- Patent Title: Clock glitch and loss detection circuit
- Patent Title (中): 时钟毛刺和损耗检测电路
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Application No.: US14219142Application Date: 2014-03-19
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Publication No.: US09413346B2Publication Date: 2016-08-09
- Inventor: Anand Kumar
- Applicant: STMicroelectronics International N.V.
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Gardere Wynne Sewell LLP
- Main IPC: H03K5/19
- IPC: H03K5/19 ; H03K5/22

Abstract:
A conversion circuit measures individual period lengths for periods of a clock signal. Two of the measured period lengths are selected and compared. The comparison operates to compare a first period length against a threshold set as a function of the second period length. The result of the comparison is indicative of the presence of a clock error. If the threshold is set less than the second period length, the comparison functions to detect a clock glitch. If the threshold is set more than the second period, the comparison functions to detect a loss of clock. The result of the comparison may be used to control further handling of the clock signal by, for example, blocking logic state changes in the clock signal for the length of one period in response to the detection of the clock error.
Public/Granted literature
- US20150270836A1 CLOCK GLITCH AND LOSS DETECTION CIRCUIT Public/Granted day:2015-09-24
Information query
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