Invention Grant
- Patent Title: Using reflected and transmission maps to detect reticle degradation
- Patent Title (中): 使用反射和透射图来检测光栅退化
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Application No.: US14381304Application Date: 2013-03-07
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Publication No.: US09417191B2Publication Date: 2016-08-16
- Inventor: Carl E. Hess , Rui-fang Shi
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Kwan & Olynick LLP
- International Application: PCT/US2013/029587 WO 20130307
- International Announcement: WO2013/142079 WO 20130926
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/95 ; G03F1/84 ; G01M11/00 ; G01N21/956

Abstract:
An optical reticle inspection tool is used during an inspection to obtain, for each local area, an average of multiple reflected intensity values corresponding to light reflected from a plurality of sub-areas of each local area of the reticle. The optical reticle inspection tool is also used during the inspection to obtain, for each local area, an average of multiple transmitted intensity values corresponding to light transmitted through the sub-areas of each local area of the reticle. A combined intensity map is generated by combining, for each local area, the average of multiple reflected intensity values and the average of multiple transmitted intensity values such that a reticle pattern of the reticle is cancelled from the combined intensity map if the reticle has not degraded and such that the reticle pattern of the reticle is not cancelled out of the combined intensity map if the reticle has degraded.
Public/Granted literature
- US20150103351A1 USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION Public/Granted day:2015-04-16
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