Invention Grant
US09431230B2 Method of extracting ions with a low M/Z ratio from an ion trap
有权
从离子阱中以低M / Z比提取离子的方法
- Patent Title: Method of extracting ions with a low M/Z ratio from an ion trap
- Patent Title (中): 从离子阱中以低M / Z比提取离子的方法
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Application No.: US14367261Application Date: 2012-11-28
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Publication No.: US09431230B2Publication Date: 2016-08-30
- Inventor: Takashi Baba
- Applicant: DH Technologies Development Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- International Application: PCT/IB2012/002524 WO 20121128
- International Announcement: WO2013/098600 WO 20130704
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
In a mass spectrometer, a method for trapping ions includes providing at least first and second multipole rod sets positioned in tandem, introducing a plurality of ions into the first rod set, applying an RF potential to at least one of said rod sets to generate a radial trapping potential within said rod sets, applying a radial DC potential to said first rod set so as to modulate said radial trapping potential set as a function of m/z of said ions, and applying a DC potential between said two rod sets to provide an axial bias potential between said two rod sets. The method can further comprise selecting an axial barrier potential to selectively extract ions having an m/z ratio less than a threshold from said first rod set into said second rod set.
Public/Granted literature
- US20150255264A1 METHOD OF EXTRACTING IONS WITH A LOW M/Z RATIO FROM AN ION TRAP Public/Granted day:2015-09-10
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