Invention Grant
- Patent Title: Solution testing equipment
- Patent Title (中): 解决方案检测设备
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Application No.: US14084658Application Date: 2013-11-20
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Publication No.: US09431960B2Publication Date: 2016-08-30
- Inventor: Toshikazu Mukai , Yuichi Ogawa
- Applicant: ROHM CO., LTD. , Kyoto University
- Applicant Address: JP Kyoto JP Kyoto
- Assignee: ROHM CO., LTD.,KYOTO UNIVERSITY
- Current Assignee: ROHM CO., LTD.,KYOTO UNIVERSITY
- Current Assignee Address: JP Kyoto JP Kyoto
- Agency: Rabin & Berdo, P.C.
- Priority: JP2012-254978 20121121
- Main IPC: G01R27/04
- IPC: G01R27/04 ; H03B7/14 ; G01N22/00

Abstract:
There is provided solution testing equipment which can detect an output variation of a THz oscillation device using a THz wave (hν) by contacting a liquid or cells on an RTD oscillation device, and can reduce the size and weight thereof. The solution testing equipment includes: a THz oscillation device configured to radiate the THz wave Is; a THz detection device configured to receive the THz wave Is; and a solution as a test object disposed on the THz oscillation device, in which the solution is tested on the basis of output characteristics of the terahertz wave varying in response to a relative permittivity of the solution.
Public/Granted literature
- US20140139238A1 SOLUTION TESTING EQUIPMENT Public/Granted day:2014-05-22
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