Invention Grant
- Patent Title: System and method for automated loss testing
- Patent Title (中): 自动化损耗测试的系统和方法
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Application No.: US14293085Application Date: 2014-06-02
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Publication No.: US09432064B2Publication Date: 2016-08-30
- Inventor: Brian D. Butler , David L. Works
- Applicant: Introbotics Corporation
- Applicant Address: US NM Albuquerque
- Assignee: INTROBOTICS CORPORATION
- Current Assignee: INTROBOTICS CORPORATION
- Current Assignee Address: US NM Albuquerque
- Agent Dennis F. Armijo
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B1/04 ; G01R27/26 ; G01R27/28 ; H04B17/00 ; H04B17/17 ; G01R1/067 ; G01R35/00 ; G01R31/11

Abstract:
A method and device for analyzing time domain waveforms traveling in electronic interconnect for the purpose of measuring the attenuation. This includes the use of an automated processing system and method to transmit a TDR step pulse into one end of an interconnect and to record the time domain waveform response from the same end of the interconnect. The processing algorithms separate the portions of the collected time domain waveform which contain return loss and insertion loss information and process each portion of that waveform data through FFT techniques to extract the frequency dependent loss data. The method describes the calibration techniques required to achieve these measurements and the device utilized can be a manual or robotic probing system.
Public/Granted literature
- US20150349899A1 SYSTEM AND METHOD FOR AUTOMATED LOSS TESTING Public/Granted day:2015-12-03
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