Invention Grant
- Patent Title: Hyperspectral imaging system, monolithic spectrometer and methods for manufacturing the monolithic spectrometer
- Patent Title (中): 高光谱成像系统,单片光谱仪和制造单片光谱仪的方法
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Application No.: US14048518Application Date: 2013-10-08
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Publication No.: US09435689B2Publication Date: 2016-09-06
- Inventor: Lovell Elgin Comstock, II , Richard Lynton Wiggins
- Applicant: CORNING INCORPORATED
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent Kevin L. Bray
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/02 ; G01J3/18 ; G01J3/24

Abstract:
A hyperspectral imaging system, a monolithic Offner spectrometer, and two methods for manufacturing the monolithic Offner spectrometer are described herein. In one embodiment, the monolithic Offner spectrometer comprises a transmissive material which has: (1) an entrance surface which has an opaque material applied thereto, where the opaque material has a portion removed therefrom which forms a slit; (2) a first surface which has a first reflective coating applied thereto to form a first mirror; (3) a second surface which has a second reflective coating applied thereto to form a diffraction grating; (4) a third surface which has a third reflective coating applied thereto to form a second mirror; and (5) an exit surface.
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