Invention Grant
US09435727B2 Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
有权
光学分析装置,光学分析方法和使用单个发光粒子检测的光学分析的计算机程序
- Patent Title: Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
- Patent Title (中): 光学分析装置,光学分析方法和使用单个发光粒子检测的光学分析的计算机程序
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Application No.: US13969830Application Date: 2013-08-19
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Publication No.: US09435727B2Publication Date: 2016-09-06
- Inventor: Takuya Hanashi , Mitsushiro Yamaguchi , Tetsuya Tanabe
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2011-071545 20110329
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N21/64 ; G01N21/51 ; G02B21/00

Abstract:
There is provided a structure to make the setting of a criterion for eliminating noises easy in the scanning molecule counting method. In the inventive optical analysis technique of detecting light of a light-emitting particle in a sample solution, time series light intensity data of light from a light detection region detected with moving the position of the light detection region in the sample solution is generated, and a signal of a light-emitting particle individually is detected in the time series light intensity data, wherein a signal having a light intensity in a light intensity range set based upon a signal generation frequency integrated value distribution which is a distribution, obtained by using as a variable an intensity of a signal, of integrated values of generation frequencies of signals having an intensity not lower than the variable is extracted as the signal of the light-emitting particle.
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