Invention Grant
- Patent Title: Method of non-destructive inspection and a device for implementing the method
- Patent Title (中): 无损检测方法及实施方法的装置
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Application No.: US13699389Application Date: 2011-05-17
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Publication No.: US09435753B2Publication Date: 2016-09-06
- Inventor: Yves Jacotin
- Applicant: Yves Jacotin
- Applicant Address: FR Paris
- Assignee: SNECMA
- Current Assignee: SNECMA
- Current Assignee Address: FR Paris
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1054181 20100528
- International Application: PCT/FR2011/051108 WO 20110517
- International Announcement: WO2011/148079 WO 20111201
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/18

Abstract:
A method of non-destructively inspecting a mechanical part includes directing high energy electromagnetic radiation emitted by a source onto the part for inspection and picking up the radiation that has passed through the part. A mask that absorbs the radiation is interposed between the source and the mechanical part and includes at least one opening in alignment with the source and a given zone for inspection of the part, a shape and dimensions of the opening being determined so that only the given zone for inspection of the part is exposed to the electromagnetic radiation.
Public/Granted literature
- US20130070897A1 METHOD OF NON-DESTRUCTIVE INSPECTION AND A DEVICE FOR IMPLEMENTING THE METHOD Public/Granted day:2013-03-21
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