Invention Grant
US09435753B2 Method of non-destructive inspection and a device for implementing the method 有权
无损检测方法及实施方法的装置

  • Patent Title: Method of non-destructive inspection and a device for implementing the method
  • Patent Title (中): 无损检测方法及实施方法的装置
  • Application No.: US13699389
    Application Date: 2011-05-17
  • Publication No.: US09435753B2
    Publication Date: 2016-09-06
  • Inventor: Yves Jacotin
  • Applicant: Yves Jacotin
  • Applicant Address: FR Paris
  • Assignee: SNECMA
  • Current Assignee: SNECMA
  • Current Assignee Address: FR Paris
  • Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
  • Priority: FR1054181 20100528
  • International Application: PCT/FR2011/051108 WO 20110517
  • International Announcement: WO2011/148079 WO 20111201
  • Main IPC: G01N23/04
  • IPC: G01N23/04 G01N23/18
Method of non-destructive inspection and a device for implementing the method
Abstract:
A method of non-destructively inspecting a mechanical part includes directing high energy electromagnetic radiation emitted by a source onto the part for inspection and picking up the radiation that has passed through the part. A mask that absorbs the radiation is interposed between the source and the mechanical part and includes at least one opening in alignment with the source and a given zone for inspection of the part, a shape and dimensions of the opening being determined so that only the given zone for inspection of the part is exposed to the electromagnetic radiation.
Information query
Patent Agency Ranking
0/0