Invention Grant
- Patent Title: Resistance detection for integrated circuit driver based on parasitic inductance
- Patent Title (中): 基于寄生电感的集成电路驱动器的电阻检测
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Application No.: US14338386Application Date: 2014-07-23
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Publication No.: US09435833B2Publication Date: 2016-09-06
- Inventor: Ibrahim S. Kandah , Kim R. Gauen
- Applicant: Freescale Semiconductor, Inc.
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: H01L27/01
- IPC: H01L27/01 ; H01L29/76 ; H01L21/336 ; G01R19/165 ; H03K17/60 ; G01R19/00 ; H03K17/18 ; H03K17/06

Abstract:
An IC driver includes a resistor detector to detect whether at least a threshold resistance is present between a pin of the IC driver and the gate of an IGBT. The resistor detector can include a comparator that compares a voltage at the collector of the IGBT to a threshold reference voltage (e.g., ground). In response to drive signals of the IC driver being switched off, a parasitic inductance causes a voltage drop at the emitter of the IGBT, and a commensurate voltage drop at the IGBT collector. If the resistance between the IC driver pin and the IGBT gate is lower than a specified level, the voltage drop at the IGBT collector will be such that the collector voltage falls below the threshold reference voltage. In response, the comparator asserts a signal indicating a fault.
Public/Granted literature
- US20160028377A1 RESISTANCE DETECTION FOR INTEGRATED CIRCUIT DRIVER Public/Granted day:2016-01-28
Information query
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