Invention Grant
- Patent Title: Sensor circuit for detecting the setting of an integrated circuit
- Patent Title (中): 用于检测集成电路设置的传感器电路
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Application No.: US14053224Application Date: 2013-10-14
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Publication No.: US09436190B2Publication Date: 2016-09-06
- Inventor: Kenneth A. Ostrom , Richard Pierson , Benjamim Tang , Clark Custer , Scott Southwell , Felix Kim
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G05F1/10 ; G01R19/00
Abstract:
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.
Public/Granted literature
- US20140035651A1 Sensor Circuit for Detecting the Setting of an Integrated Circuit Public/Granted day:2014-02-06
Information query
