Invention Grant
US09436539B2 Synchronized debug information generation 有权
同步调试信息生成

Synchronized debug information generation
Abstract:
In an approach for determining a location of failure between interconnects/controller, a computer collects debug information simultaneously at a plurality of nodes coupled to an interconnect. Subsequent to collecting debug information, the computer analyzes the debug information collected simultaneously thereby determining which end of the interconnect caused the failure.
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