Invention Grant
- Patent Title: Synchronized debug information generation
- Patent Title (中): 同步调试信息生成
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Application No.: US14151386Application Date: 2014-01-09
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Publication No.: US09436539B2Publication Date: 2016-09-06
- Inventor: Ajay K. Mahajan , Venkatesh Sainath , Vishwanatha Subbanna
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Maeve Carpenter
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
In an approach for determining a location of failure between interconnects/controller, a computer collects debug information simultaneously at a plurality of nodes coupled to an interconnect. Subsequent to collecting debug information, the computer analyzes the debug information collected simultaneously thereby determining which end of the interconnect caused the failure.
Public/Granted literature
- US20150121145A1 SYNCHRONIZED DEBUG INFORMATION GENERATION Public/Granted day:2015-04-30
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