Invention Grant
- Patent Title: High sensitivity flat panel microbiology detection and enumeration system
- Patent Title (中): 高灵敏度平板微生物检测和计数系统
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Application No.: US14449916Application Date: 2014-08-01
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Publication No.: US09436866B2Publication Date: 2016-09-06
- Inventor: Aaron Judy Couture , Faisal Ahmed Syud , John Brian Hewgley , Yu Zhao
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Ziolkowski Patent Solutions Group, SC
- Agent Jean K. Testa
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
A flat panel imaging system for imaging cells provided on a cell medium is disclosed. The system includes a housing having a base portion and a lid that collectively form a closed environment to exclude external sources of light, and a flat panel detector encased in the base portion and having an array of pixels each including a photodiode and transistor. The system also includes a first light source that illuminates cells on the cell medium to excite at least a portion of the cells and cause those cells to generate photons that are captured by the array of pixels and a second light source to illuminate cells on the cell medium with a light different from the light from the first light source and that provides for a capturing of photons representative of photons transmitted through the cells on the cell medium.
Public/Granted literature
- US20160034745A1 HIGH SENSITIVITY FLAT PANEL MICROBIOLOGY DETECTION AND ENUMERATION SYSTEM Public/Granted day:2016-02-04
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