Invention Grant
- Patent Title: Method of testing thermally-assisted magnetic head
- Patent Title (中): 热辅助磁头测试方法
-
Application No.: US14710735Application Date: 2015-05-13
-
Publication No.: US09437226B1Publication Date: 2016-09-06
- Inventor: Tadatoshi Koba , Seiichi Takayama , Ryuji Fujii , Takashi Honda , Osamu Harakawa , Masahiro Kuribayashi
- Applicant: SAE Magnetics (H.K.) Ltd.
- Applicant Address: CN Hong Kong
- Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee Address: CN Hong Kong
- Agency: Nixon & Vanderhye PC
- Main IPC: G11B5/455
- IPC: G11B5/455 ; G11B5/127 ; G11B5/00 ; G11B5/60 ; G11B5/012

Abstract:
A method of testing a TAMH includes providing a slider body having a waveguide embedded therein with an incidence end extending toward a back surface of the slider body; providing a light source unit including a light source and a unit substrate; coating a bonding material layer on the back surface, under the bottom, or both on the back surface and under the bottom of the unit substrate; coating a localization material layer on the back surface; aligning the light source unit to the slider body; causing a light emitted from the light source and allowed to be incident on the incidence end to anneal the localization material layer to generate an annealing mark; removing the light source unit or the light source from the slider body; and measuring a position offset between the annealing mark and the incidence end. The method can evaluate alignment accuracy of a slider body and a light source unit in two dimensional directions.
Information query
IPC分类: