Invention Grant
- Patent Title: System and method for phase-contrast X-ray imaging
- Patent Title (中): 用于相位对比X射线成像的系统和方法
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Application No.: US14174830Application Date: 2014-02-06
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Publication No.: US09439613B2Publication Date: 2016-09-13
- Inventor: Dan Stutman , Michael Finkenthal
- Applicant: THE JOHNS HOPKINS UNIVERSITY
- Applicant Address: US MD Baltimore
- Assignee: The Johns Hopkins University
- Current Assignee: The Johns Hopkins University
- Current Assignee Address: US MD Baltimore
- Agency: MH2 Technology Law Group LLP
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G06K9/20 ; G02B5/18 ; A61B6/00 ; G01N23/20 ; G01N23/04 ; G02B6/02 ; G01N15/14 ; G01N21/41
Abstract:
A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.
Public/Granted literature
- US20140226785A1 SYSTEM AND METHOD FOR PHASE-CONTRAST X-RAY IMAGING Public/Granted day:2014-08-14
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