Invention Grant
US09441941B2 Deformation measurement sensor for measuring pressure and shearing force and structure therefor
有权
用于测量压力和剪切力的变形测量传感器及其结构
- Patent Title: Deformation measurement sensor for measuring pressure and shearing force and structure therefor
- Patent Title (中): 用于测量压力和剪切力的变形测量传感器及其结构
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Application No.: US14409154Application Date: 2012-11-01
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Publication No.: US09441941B2Publication Date: 2016-09-13
- Inventor: Junghoon Hwang , Youngouk Kim
- Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
- Applicant Address: KR Seongnam-Si, Gyeonggi-Do
- Assignee: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
- Current Assignee: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
- Current Assignee Address: KR Seongnam-Si, Gyeonggi-Do
- Agency: Hauptman Ham, LLP
- Priority: KR10-2012-0067119 20120622
- International Application: PCT/KR2012/009118 WO 20121101
- International Announcement: WO2013/191333 WO 20131227
- Main IPC: G01L1/22
- IPC: G01L1/22 ; G01B7/16 ; G01L1/18 ; G01L5/00 ; G01L5/16 ; G01L1/20
Abstract:
A deformation measurement sensor for measuring pressures and shearing forces according to the present invention includes: a plurality of beams shaped like a lattice; a strain gauge attached to each of the plurality of beams for measuring a deformation rate; a frame connected to the end of the lattice shape for surrounding the plurality of beams; and holes for arranging lines and formed in the intersections of the plurality of beams, whereby it is possible to precisely measure the deformation rate depending on the pressures or shearing forces exerted to a plurality of areas.
Public/Granted literature
- US20150143915A1 DEFORMATION MEASUREMENT SENSOR FOR MEASURING PRESSURE AND SHEARING FORCE AND STRUCTURE THEREFOR Public/Granted day:2015-05-28
Information query
