Invention Grant
- Patent Title: Method and apparatus for measuring the shape of a wave-front of an optical radiation field
- Patent Title (中): 用于测量光辐射场的波前形状的方法和装置
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Application No.: US14751259Application Date: 2015-06-26
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Publication No.: US09442006B2Publication Date: 2016-09-13
- Inventor: Thomas Oberdoerster
- Applicant: Berliner Glas KGaA Herbert Kubatz GmbH & Co.
- Applicant Address: DE Berlin
- Assignee: Berliner Glas KGaA Herbert Kubatz GmbH & Co.
- Current Assignee: Berliner Glas KGaA Herbert Kubatz GmbH & Co.
- Current Assignee Address: DE Berlin
- Agency: Caesar Rivise, PC
- Priority: DE102014010667 20140718
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01J1/42 ; G01J1/04

Abstract:
Method for measuring shape of wavefront of optical radiation field generated by radiation source, includes: (a) setting diaphragm positions in pinhole diaphragm having diaphragm opening movable transversely to radiation source's optical axis, wherein a partial beam from radiation field passes through diaphragm opening at each diaphragm position and is imaged on optical sensor by imaging optics device; (b) recording lateral positions of partial beam relative to optical axis of imaging optics device, wherein lateral positions each with one of the diaphragm positions of pinhole diaphragm are recorded by optical sensor, and determining the shape of wavefront from recorded lateral positions of partial beam, wherein beam incidence range of the partial beam which is invariable for all diaphragm positions is set on imaging optics device with a pentaprism arrangement including at least first pentaprism and positioned between pinhole diaphragm and imaging optics device. A wavefront shape measuring device is also described.
Public/Granted literature
- US20160018259A1 METHOD AND APPARATUS FOR MEASURING THE SHAPE OF A WAVE-FRONT OF AN OPTICAL RADIATION FIELD Public/Granted day:2016-01-21
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