Invention Grant
US09442167B1 Method and apparatus for using tester channel as device power supply
有权
使用测试仪通道作为设备电源的方法和设备
- Patent Title: Method and apparatus for using tester channel as device power supply
- Patent Title (中): 使用测试仪通道作为设备电源的方法和设备
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Application No.: US13422725Application Date: 2012-03-16
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Publication No.: US09442167B1Publication Date: 2016-09-13
- Inventor: Boon Tean Leow
- Applicant: Boon Tean Leow
- Applicant Address: US CA San Jose
- Assignee: INTEGRATED DEVICE TECHNOLOGY, INC.
- Current Assignee: INTEGRATED DEVICE TECHNOLOGY, INC.
- Current Assignee Address: US CA San Jose
- Agency: Heimlich Law, PC
- Agent Alan Heimlich, Esq.
- Main IPC: G01R31/40
- IPC: G01R31/40 ; G01R19/00
Abstract:
A method and apparatus for using a tester channel as device power have been disclosed. By utilizing a tester channel output as an input, a voltage and current driver are used to boost the input which is followed by a current to voltage converter which can be used as a device power supply for a device under test. Additional tester channels may be used to sense and force voltages, measure currents, supply output voltage, and relay control, etc. for changing operation.
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