Invention Grant
US09442192B2 Method and apparatus for location determination using reflected interferometry
有权
使用反射干涉法进行位置确定的方法和装置
- Patent Title: Method and apparatus for location determination using reflected interferometry
- Patent Title (中): 使用反射干涉法进行位置确定的方法和装置
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Application No.: US12505916Application Date: 2009-07-20
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Publication No.: US09442192B2Publication Date: 2016-09-13
- Inventor: Gregory D. Durgin
- Applicant: Gregory D. Durgin
- Applicant Address: US GA Altanta
- Assignee: Thingamagigwerks, LLC
- Current Assignee: Thingamagigwerks, LLC
- Current Assignee Address: US GA Altanta
- Agent Philip H. Burrus, IV
- Main IPC: G01S13/00
- IPC: G01S13/00 ; G01S13/87 ; G01S13/75 ; G01S13/84

Abstract:
A system (200) and method (400) for determining the location of an object is provided. A plurality of radio transceivers (101,201,203,205) are disposed about a location of interest (221). One or more tags (102) are coupled to an object. The radio transceivers (101,201,203,205) transmit radio frequency signals (115,215,217,219) to the tag (102), which backscatters a return signal (116,216,218,220) having a unique identifier modulated therein due to a switch (108) switching between two or more loads (110,112) in accordance with a unique identification code (118). A location determination module (107) then determines the location of the tag (102) by using a course location estimate (502), a fine location estimate (503), or combinations thereof. A object modeling module (109) can create multidimensional models using the locations of the tags (102).
Public/Granted literature
- US20100019955A1 Method and Apparatus for Location Determination Using Reflected Interferometry Public/Granted day:2010-01-28
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