Invention Grant
- Patent Title: Selective display of waveforms governed by measured parameters
- Patent Title (中): 由测量参数控制的波形的选择性显示
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Application No.: US13538978Application Date: 2012-06-29
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Publication No.: US09443490B2Publication Date: 2016-09-13
- Inventor: Benjamin A. Ward , Kenneth P. Dobyns , Gary J. Waldo
- Applicant: Benjamin A. Ward , Kenneth P. Dobyns , Gary J. Waldo
- Applicant Address: US OR Beaverton
- Assignee: TEKTRONIX, INC.
- Current Assignee: TEKTRONIX, INC.
- Current Assignee Address: US OR Beaverton
- Agent Thomas F. Lenihan; Marger Johnson
- Main IPC: G01R23/00
- IPC: G01R23/00 ; G09G5/10 ; G09G5/00

Abstract:
Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.
Public/Granted literature
- US20140002508A1 SELECTIVE DISPLAY OF WAVEFORMS GOVERNED BY MEASURED PARAMETERS Public/Granted day:2014-01-02
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