Invention Grant
US09443589B2 Method for capacitively reading resistive memory elements and nonvolatile, capacitively readable memory elements for implementing the method
有权
用于电容读取电阻性存储器元件的方法和用于实现该方法的非易失性,电容可读存储元件
- Patent Title: Method for capacitively reading resistive memory elements and nonvolatile, capacitively readable memory elements for implementing the method
- Patent Title (中): 用于电容读取电阻性存储器元件的方法和用于实现该方法的非易失性,电容可读存储元件
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Application No.: US14895345Application Date: 2014-05-17
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Publication No.: US09443589B2Publication Date: 2016-09-13
- Inventor: Stefan Tappertzhofen , Eike Linn , Lutz Nielen , Rainer Waser , Ilia Valov
- Applicant: FORSCHUNGSZENTRUM JUELICH GMBH , RHEINISCH-WESTFAELISCHE TECHNISCHE HOCHSCHULE (RWTH) AACHEN
- Applicant Address: DE Juelich DE Aachen
- Assignee: Forschungszentrum Juelich GmbH,Rheinisch-Westfaelische Technisque Hochschule (RWTH) Aachen
- Current Assignee: Forschungszentrum Juelich GmbH,Rheinisch-Westfaelische Technisque Hochschule (RWTH) Aachen
- Current Assignee Address: DE Juelich DE Aachen
- Agency: Jordan and Koda PLLC
- Priority: DE102013010411 20130621; DE102014002288 20140219
- International Application: PCT/DE2014/000257 WO 20140517
- International Announcement: WO2014/202038 WO 20141224
- Main IPC: G11C14/00
- IPC: G11C14/00 ; G11C13/00 ; G11C11/56 ; G11C11/16

Abstract:
A method for reading out a non-volatile memory element having at least two stable states 0 and 1. This memory element comprises at least one resistive memory cell, which encodes the two states 0 and 1 into a state HRS having higher electrical resistance and a state LRS having lower electrical resistance. In the two states 0 and 1, the memory element has differing capacitances C0,1; this difference is used to determine which state is present. A memory element is selected in which a fixed capacitance that is independent of the state of the memory cell is connected in series with the memory cell. A series connection of a resistive memory cell with a fixed capacitance, instead of with a second resistive memory cell, improves the signal strength during capacitive read-out. The second memory cell becomes indispensable for the memory function when the memory element is read out capacitively. Moreover memory elements were developed which combine a field effect transistor or a DRAM structure with a resistive memory cell or an antiserial series connection of such memory cells.
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