Invention Grant
US09443613B2 Advanced memory test diagnostics 有权
高级内存测试诊断

Advanced memory test diagnostics
Abstract:
For performing advanced memory test diagnostics, an apparatus, method, and computer program product are disclosed. The apparatus may include a processor, a memory that stores code executable by the processor, an address space module that identifies an address space having a plurality of blocks of memory addresses, a memory diagnostic module that performs, at least three times, a memory test procedure using a block pattern, wherein a first block pattern is used the first time, a second block pattern is used the second time, and a third block pattern is used the third time, and a memory fault module that determines the presence of a memory fault based on results of the memory test procedures.
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