Invention Grant
- Patent Title: Advanced memory test diagnostics
- Patent Title (中): 高级内存测试诊断
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Application No.: US14229452Application Date: 2014-03-28
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Publication No.: US09443613B2Publication Date: 2016-09-13
- Inventor: Arnold S. Weksler , André Breda Carneiro , Rodrigo Fernandes Freitas , Frederico Rhae Maciel Leal , Marcelo Araujo Lima , Fernando José Vieira da Silva , Fernando Ferraz Silva , Francisco Plinio Oliveira Silveira
- Applicant: LENOVO (Singapore) PTE, LTD.
- Applicant Address: SG New Tech Park
- Assignee: Lenovo (Singapore) PTE. LTD.
- Current Assignee: Lenovo (Singapore) PTE. LTD.
- Current Assignee Address: SG New Tech Park
- Agency: Kunzler Law Group
- Main IPC: G11C29/18
- IPC: G11C29/18 ; G11C29/10 ; G11C29/44

Abstract:
For performing advanced memory test diagnostics, an apparatus, method, and computer program product are disclosed. The apparatus may include a processor, a memory that stores code executable by the processor, an address space module that identifies an address space having a plurality of blocks of memory addresses, a memory diagnostic module that performs, at least three times, a memory test procedure using a block pattern, wherein a first block pattern is used the first time, a second block pattern is used the second time, and a third block pattern is used the third time, and a memory fault module that determines the presence of a memory fault based on results of the memory test procedures.
Public/Granted literature
- US20150279485A1 ADVANCED MEMORY TEST DIAGNOSTICS Public/Granted day:2015-10-01
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