One feature pertains to a single data pattern being read from a pattern register located within a memory circuit or device. At least one of the plurality of data patterns is derived from the single data pattern, and the plurality of data patterns may be used in a test and sent to an output driver of the memory circuit. The plurality of data patterns may include a first data pattern and a second data pattern. The first data pattern may be derived from the single data pattern. The second data pattern is one of either a true copy of the single data pattern, an inverse copy of the single data pattern, an all zero bits data pattern, or an all one bits data pattern.