Invention Grant
- Patent Title: Feature detection in image capture
- Patent Title (中): 图像捕获中的特征检测
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Application No.: US14452377Application Date: 2014-08-05
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Publication No.: US09444999B2Publication Date: 2016-09-13
- Inventor: Ming-Kai Hsu
- Applicant: OMNIVISION TECHNOLOGIES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely Sokoloff Taylor & Zafman LLP
- Main IPC: H04N5/228
- IPC: H04N5/228 ; G06K9/46 ; H04N5/232 ; G06K9/00 ; G06K9/62
Abstract:
A feature detection process includes identifying an approximate location of a feature in a preliminary image. A gradient phase map of image pixel intensities within the approximate location is computed. A projection result is determined by applying a projection function to the gradient phase map. The projection result is analyzed to determine a state of the feature.
Public/Granted literature
- US20160044237A1 FEATURE DETECTION IN IMAGE CAPTURE Public/Granted day:2016-02-11
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