Invention Grant
- Patent Title: Method for detecting and quantifying wheat endogenous gene
- Patent Title (中): 检测和定量小麦内源基因的方法
-
Application No.: US14189575Application Date: 2014-02-25
-
Publication No.: US09447475B2Publication Date: 2016-09-20
- Inventor: Kazumi Kitta , Satoshi Furui , Junichi Mano , Shinjiro Imai , Keiko Tanaka , Yasuyuki Matsuoka , Shinichiro Arami , Megumi Sato , Hiroyuki Haraguchi , Youichi Kurimoto
- Applicant: Nisshin Seifun Group Inc.
- Applicant Address: JP Tokyo
- Assignee: NISSHIN SEIFUN GROUP INC.
- Current Assignee: NISSHIN SEIFUN GROUP INC.
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2009-289137 20091221
- Main IPC: C07H21/04
- IPC: C07H21/04 ; C12Q1/68

Abstract:
Provided is a method of detecting or quantifying a wheat species-specific DNA in a test sample by polymerase chain reaction. The method comprises a step of amplifying a nucleic acid molecule having at partial sequence of a nucleotide sequence identified as SEQ ID NO: 1 using a nucleic acid molecule in the test sample or a nucleic acid molecule extracted from the test sample as the template and using a primer pair capable of amplifying the partial sequence and a step of detecting or quantifying the amplified nucleic acid molecule.
Public/Granted literature
- US20140288289A1 METHOD FOR DETECTING AND QUANTIFYING WHEAT ENDOGENOUS GENE Public/Granted day:2014-09-25
Information query