Invention Grant
- Patent Title: Apparatus and measurement method based on incident positions of emitted light
- Patent Title (中): 基于发射光的入射位置的装置和测量方法
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Application No.: US14679434Application Date: 2015-04-06
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Publication No.: US09448520B2Publication Date: 2016-09-20
- Inventor: Kunitoshi Aoki
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Carter, DeLuca, Farrell & Schmidt, LLP
- Priority: JP2014-082311 20140411
- Main IPC: G03G15/00
- IPC: G03G15/00

Abstract:
There is provided with an apparatus. A measurement unit emits light to an image carrier conveying a toner image and measures an incident position of the light in a direction perpendicular to a surface of the image carrier by observing the emitted light. The measurement unit has an irradiation unit configured to emit the first light and the second light and an observation unit configured to observe the first light and the second light. The irradiation unit emits the first light and the second light at positions separate from each other in a direction perpendicular to a conveyance direction of the toner image, with irradiation directions of the first light and the second light being substantially orthogonal to the direction perpendicular to the conveyance direction of the toner image.
Public/Granted literature
- US20150293489A1 APPARATUS AND MEASUREMENT METHOD Public/Granted day:2015-10-15
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