Invention Grant
- Patent Title: System on chip and verification method thereof
- Patent Title (中): 片上系统及其验证方法
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Application No.: US14680337Application Date: 2015-04-07
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Publication No.: US09448917B2Publication Date: 2016-09-20
- Inventor: Sung-Boem Park , Jin-Sung Park , Ara Cho
- Applicant: Sung-Boem Park , Jin-Sung Park , Ara Cho
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0091962 20140721
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F9/44

Abstract:
A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
Public/Granted literature
- US20150293835A1 SYSTEM ON CHIP AND VERIFICATION METHOD THEREOF Public/Granted day:2015-10-15
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