Invention Grant
- Patent Title: Wide band gap semiconductor device
- Patent Title (中): 宽带隙半导体器件
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Application No.: US12718514Application Date: 2010-03-05
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Publication No.: US09450084B2Publication Date: 2016-09-20
- Inventor: Katsunori Ueno
- Applicant: Katsunori Ueno
- Applicant Address: JP Kawasaki-shi
- Assignee: FUJI ELECTRIC SYSTEMS CO. LTD.
- Current Assignee: FUJI ELECTRIC SYSTEMS CO. LTD.
- Current Assignee Address: JP Kawasaki-shi
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2009-108794 20090428
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/16 ; H01L29/20 ; H02M7/00

Abstract:
A semiconductor device having high reliability and high load short circuit withstand capability while maintaining a low ON resistance is provided, by using a WBG semiconductor as a switching element of an inverter circuit. In the semiconductor device for application to a switching element of an inverter circuit, a band gap of a semiconductor material is wider than that of silicon, a circuit that limits a current when a main transistor is short circuited is provided, and the main transistor that mainly serves to pass a current, a sensing transistor that is connected in parallel to the main transistor and detects a microcurrent proportional to a current flowing in the main transistor, and a lateral MOSFET that controls a gate of the main transistor on the basis of an output of the sensing transistor are formed on the same semiconductor.
Public/Granted literature
- US20100270586A1 WIDE BAND GAP SEMICONDUCTOR DEVICE Public/Granted day:2010-10-28
Information query
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