Invention Grant
- Patent Title: Utilization of wall thickness measurement in combination with thermal imaging of containers
- Patent Title (中): 利用壁厚测量结合容器的热成像
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Application No.: US14081330Application Date: 2013-11-15
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Publication No.: US09458043B2Publication Date: 2016-10-04
- Inventor: Jonathan S. Simon
- Applicant: Emhart Glass S.A.
- Applicant Address: CH Cham
- Assignee: Emhart Glass S.A.
- Current Assignee: Emhart Glass S.A.
- Current Assignee Address: CH Cham
- Agency: Reinhart Boerner Van Deuren s.c.
- Main IPC: G06F19/00
- IPC: G06F19/00 ; C03B9/41 ; G01N33/38 ; G01J5/00 ; G01N21/90

Abstract:
A closed loop temperature and wall thickness-based control system for improving process yield and quality while reducing dependence on operator skill utilizes intensity information from a hot end container imaging system and wall thickness information from a hot glass container wall thickness measurement system. By utilizing both the container intensity information and the measured wall thickness information it is possible to provide separate feedback signals responsive to temperature variations and thickness variations. These signals are used to implement automatic closed loop control of the I.S. machine.
Public/Granted literature
- US20150142163A1 Utilization of Wall Thickness Measurement in Combination With Thermal Imaging of Containers Public/Granted day:2015-05-21
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