Invention Grant
- Patent Title: Analyzer and automatic analyzer
- Patent Title (中): 分析仪和自动分析仪
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Application No.: US14775544Application Date: 2014-03-31
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Publication No.: US09459271B2Publication Date: 2016-10-04
- Inventor: Takeshi Yogi , Sakuichiro Adachi , Hajime Yamazaki
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge PC
- Priority: JP2013-076932 20130402
- International Application: PCT/JP2014/059434 WO 20140331
- International Announcement: WO2014/163037 WO 20141009
- Main IPC: G01N21/49
- IPC: G01N21/49 ; G01N35/02 ; G01N35/10 ; G01N21/25 ; G01N21/51 ; G01N21/82 ; G01N35/04

Abstract:
To reduce the influence of air bubbles and dust in measuring scattered light beams on an automatic analyzer. A light source emits a light beam with a first wavelength 18a on a shorter wavelength side and a light beam with a second wavelength 18b on a longer wavelength side, and then, transmitted light beams 19a and 19b and scattered light beams 21a and 21b are received. Noise is estimated from the ratio between the intensities of the transmitted light beams with the first wavelength and the second wavelength and a change in the amount of the scattered light beam with the second wavelength. Then, the estimated noise is subtracted from a change in the amount of the scattered light beam with the first wavelength, so that noise due to air bubbles and dust is reduced.
Public/Granted literature
- US20160025758A1 ANALYZER AND AUTOMATIC ANALYZER Public/Granted day:2016-01-28
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