Invention Grant
US09459286B2 Large-area probe card and method of manufacturing the same 有权
大面积探针卡及其制造方法

Large-area probe card and method of manufacturing the same
Abstract:
A large-area probe card and method of manufacturing the same including an insulation plate including at least one contactor formed thereon, a main substrate disposed below the insulation plate, and a flexible signal connector vertically passing through the insulation plate and disposed between the at least one contactor and the main substrate to electrically connect the at least one contactor with the main substrate.
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