Invention Grant
- Patent Title: Large-area probe card and method of manufacturing the same
- Patent Title (中): 大面积探针卡及其制造方法
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Application No.: US14463056Application Date: 2014-08-19
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Publication No.: US09459286B2Publication Date: 2016-10-04
- Inventor: Kyu Han Lee , Hee Seok Jung
- Applicant: GigaLane Co., Ltd.
- Applicant Address: KR Hwaseong-Si
- Assignee: GIGALANE CO., LTD.
- Current Assignee: GIGALANE CO., LTD.
- Current Assignee Address: KR Hwaseong-Si
- Agency: Polsinelli PC
- Priority: KR10-2013-0101346 20130826
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/073 ; G01R3/00

Abstract:
A large-area probe card and method of manufacturing the same including an insulation plate including at least one contactor formed thereon, a main substrate disposed below the insulation plate, and a flexible signal connector vertically passing through the insulation plate and disposed between the at least one contactor and the main substrate to electrically connect the at least one contactor with the main substrate.
Public/Granted literature
- US20150054541A1 Large-Area Probe Card and Method of Manufacturing the Same Public/Granted day:2015-02-26
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