An in-circuit testing auto open and close system, apparatus and method includes an in-circuit tester having an upper panel and a lower panel, wherein the upper and lower panels are used to test electrical connections of one or more electronic units. One or more actuators are each coupled to both the upper panel and the lower panel such that they are able to move the upper and lower panels with respect to each other. As a result, a controller coupled with the in-circuit tester and the actuators is able to cause the actuators to automatically close the panels such that the panels sandwich the electronic units at the beginning of a testing program and to automatically open the panels such that the panels are separated at the end of the testing program.