Invention Grant
- Patent Title: Inverter test apparatus
- Patent Title (中): 变频器测试仪
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Application No.: US13799979Application Date: 2013-03-13
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Publication No.: US09459310B2Publication Date: 2016-10-04
- Inventor: Ruben Alexis Inzunza Figueroa , Tatsuaki Amboh
- Applicant: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: JP2012-056351 20120313
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; G01R31/42

Abstract:
There is provided an inverter test apparatus for testing an inverter interconnected with an alternating-current power system, the apparatus including an alternating-current power output unit configured to output alternating-current power, and an alternating-current power controller configured to control the alternating-current power output from the alternating-current power output unit to simulate an alternating-current load of the inverter.
Public/Granted literature
- US20130241585A1 INVERTER TEST APPARATUS Public/Granted day:2013-09-19
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