A testing apparatus includes a base mounted on a motherboard, an inserting unit mounted on the base, a movable unit secured to the inserting unit, and a driving device mounted between the movable unit and the base. The movable unit is driven to move by the driving device, thereby enabling the inserting unit to move to enable the expansion card to be inserted into the motherboard. The movable unit is driven to move by the driving device, thereby enabling the inserting unit to move to enable the expansion card to move out of the motherboard.