Invention Grant
- Patent Title: Method for adjusting a calibration element, and corresponding device
- Patent Title (中): 调整校准元件的方法及相应的装置
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Application No.: US14390533Application Date: 2013-03-29
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Publication No.: US09460834B2Publication Date: 2016-10-04
- Inventor: Mattia Croci
- Applicant: METALLUX SA
- Applicant Address: CH Mendrisio
- Assignee: METALLUX SA
- Current Assignee: METALLUX SA
- Current Assignee Address: CH Mendrisio
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Victor A. Cardona, Esq.
- Priority: ITTO2012A0293 20120403
- International Application: PCT/IB2013/052553 WO 20130329
- International Announcement: WO2013/150435 WO 20131010
- Main IPC: H01C10/00
- IPC: H01C10/00 ; H01C17/24 ; G01L25/00 ; G01L9/00 ; G01L27/00 ; G01L9/04 ; H01C17/23 ; H01C17/242

Abstract:
A method for adjusting the electrical behavior or characteristics of a calibration element includes adjusting the electrical behavior or characteristics of the calibration element by making one or more incisions or cuts in the calibration element. The calibration element has a plurality of apertures, and the method includes making an incision or cut in the calibration element between an edge thereof and at least one of the apertures, and/or making an incision or cut in the calibration element between at least two of the apertures.
Public/Granted literature
- US20150318087A1 METHOD FOR ADJUSTING A CALIBRATION ELEMENT, AND CORRESPONDING DEVICE Public/Granted day:2015-11-05
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