Invention Grant
- Patent Title: Semiconductor device and manufacturing method of the same
- Patent Title (中): 半导体器件及其制造方法相同
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Application No.: US14699611Application Date: 2015-04-29
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Publication No.: US09461057B2Publication Date: 2016-10-04
- Inventor: Young Jin Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0164341 20141124
- Main IPC: H01L27/115
- IPC: H01L27/115 ; H01L21/768

Abstract:
A semiconductor device may include semiconductor patterns. The semiconductor device may include insulating layers including first regions surrounding the semiconductor patterns and second regions isolated from each other by island-type first openings and connecting the first regions adjacent to each other. The semiconductor device may include metal layers interposed between the first regions of the stacked insulating layers surrounding the semiconductor patterns, and isolated from each other by line-type second openings overlapping the first openings and the second regions. The semiconductor device may include dielectric patterns partially interposed between the insulating layers and the metal layers and exposed through the second openings.
Public/Granted literature
- US20160148941A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME Public/Granted day:2016-05-26
Information query
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