Invention Grant
- Patent Title: Run-time instrumentation directed sampling
- Patent Title (中): 运行时间仪表定向采样
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Application No.: US13422532Application Date: 2012-03-16
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Publication No.: US09465716B2Publication Date: 2016-10-11
- Inventor: Charles W. Gainey, Jr. , Marcel M. Mitran , Chung-Lung K. Shum , Kevin Stoodley
- Applicant: Charles W. Gainey, Jr. , Marcel M. Mitran , Chung-Lung K. Shum , Kevin Stoodley
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent William A. Kinnaman, Jr.
- Main IPC: G06F11/34
- IPC: G06F11/34 ; G06F11/36

Abstract:
The invention relates to implementing run-time instrumentation directed sampling. An aspect of the invention includes fetching a run-time instrumentation next (RINEXT) instruction from an instruction stream. The instruction stream includes the RINEXT instruction followed by a next sequential instruction (NSI) in program order. The method further includes executing the RINEXT instruction by a processor. The executing includes determining whether a current run-time instrumentation state enables setting a sample point for reporting run-time instrumentation information during program execution. Based on the current run-time instrumentation state enabling setting the sample point, the NSI is a sample instruction for causing a run-time instrumentation event. Based on executing the NSI sample instruction, the run-time instrumentation event causes recording of run-time instrumentation information into a run-time instrumentation program buffer as a reporting group.
Public/Granted literature
- US20130246741A1 RUN-TIME INSTRUMENTATION DIRECTED SAMPLING Public/Granted day:2013-09-19
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