According to one embodiment, a semiconductor memory device includes a source voltage adjustment circuit and a word line voltage adjustment circuit, which are configured to respectively supply a source voltage supply end and a word line switchingly with voltage-adjusted voltages, in response to a mode switching signal for switching between a retention state mode and an active state mode, wherein the source voltage supply end is connected to sources of MOS transistors forming a flip-flop of a memory cell, and the word line is connected to gates of access transistors.