Invention Grant
- Patent Title: FinFETs with multiple threshold voltages
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Application No.: US14825665Application Date: 2015-08-13
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Publication No.: US09472638B2Publication Date: 2016-10-18
- Inventor: Po-Chin Kuo , Hsien-Ming Lee
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/49 ; H01L29/423 ; H01L29/66 ; H01L21/28 ; H01L21/306

Abstract:
A device includes a substrate, a semiconductor fin over the substrate, and a gate dielectric layer on a top surface and sidewalls of the semiconductor fin. A gate electrode is spaced apart from the semiconductor fin by the gate dielectric layer. The gate electrode includes a top portion over and aligned to the semiconductor fin, and a sidewall portion on a sidewall portion of the dielectric layer. The top portion of the gate electrode has a first work function, and the sidewall portion of the gate electrode has a second work function different from the first work function.
Public/Granted literature
- US20150349080A1 FinFETs with Multiple Threshold Voltages Public/Granted day:2015-12-03
Information query
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