Method for producing a semiconductor device

Invention Grant

US09472655B1 Method for producing a semiconductor device 有权

Title translation: 半导体器件的制造方法

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Patent Title: Method for producing a semiconductor device
Patent Title (中): 半导体器件的制造方法
Application No.: US15017612

Application Date: 2016-02-06
Publication No.: US09472655B1

Publication Date: 2016-10-18
Inventor: Tatsuyoshi Mihara
Applicant: Renesas Electronics Corporation
Applicant Address: JP Tokyo
Assignee: Renesas Electronics Corporation
Current Assignee: Renesas Electronics Corporation
Current Assignee Address: JP Tokyo
Agency: Shapiro, Gabor and Rosenberger, PLLC
Priority: JP2015-070432 20150330
Main IPC: H01L21/8234
IPC: H01L21/8234 ; H01L29/66 ; H01L27/115 ; H01L29/08 ; H01L29/423 ; H01L29/40

Method for producing a semiconductor device

Abstract:

An improvement is made in the reliability of a semiconductor device having a split gate type MONOS memory. An ONO film covering a control gate electrode, and a dummy memory electrode gates are formed, and then a diffusion region on a source-region-side of a memory to produced is formed across the dummy memory electrode gates. Subsequently, the dummy memory electrode gates is removed, and then a memory gate electrode is formed which is smaller in gate length than the dummy memory electrode gates. Thereafter, an extension region on the source-region-side of the memory is formed.

Abstract(Chinese):

具有分离栅型MONOS存储器的半导体器件的可靠性得到改进。形成覆盖控制栅电极的ONO膜和虚设存储电极栅极，然后在伪存储电极栅极之间形成在要产生的存储器的源极区侧的扩散区域。随后，去除虚拟存储器电极栅极，然后形成栅极长度比虚拟存储器电极栅极小的存储栅电极。此后，形成存储器的源极 - 区域侧上的延伸区域。

Public/Granted literature

US20160293738A1 METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE Public/Granted day:2016-10-06

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/70	.由在一共用基片内或其上形成的多个固态组件或集成电路组成的器件或其部件的制造或处理；集成电路器件或其特殊部件的制造（由预制电组件组成的组装件的制造入H05K3/00，H05K13/00）
H01L21/77	..在公共衬底中或上面形成的由许多固态元件或集成电路组成的器件的制造或处理（电可编程只读存储器或其多步骤的制造方法入H01L27/115）
H01L21/78	...把衬底连续地分成多个独立的器件（改变表面物理特性或者半导体形状的切割入H01L21/304）
H01L21/82	....制造器件，例如每一个由许多元件组成的集成电路
H01L21/822	.....衬底是采用硅工艺的半导体的（H01L21/8258优先）
H01L21/8232	......场效应工艺
H01L21/8234	.......MIS工艺